Method of evaluating semiconductor device without electrical inf

Details Method of evaluating semiconductor device without electrical inf Method of evaluating semiconductor device without electrical inf

1996-08-07

1998-03-03

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

G01R 3126

Patent

active

057239835

ABSTRACT:
A circuit component such as a field effect transistor in a semiconductor device is evaluated without an influence of parasitic components by comparing a set of y-parameters or a set of z-parameters of the circuit component with a set of y-parameters or a set of z-parameters of a first comparative sample equivalent to the semiconductor device without the circuit component and a set of y-parameters or a set of z-parameters of a second comparative sample equivalent to the semiconductor device with the circuit component short-circuited, and the sets of y-parameters or z-parameters are obtained from sets of four-terminal parameters measured under the same conditions.

REFERENCES:
patent: 4894612 (1990-01-01), Drake et al.
patent: 5396184 (1995-03-01), Frank et al.
S. Lee et al., "New Circuit Model for RF Probe Pads and Interconnections for the Extraction of HBT Equivalent Circuits," IEEE Electron Device Letters, vol. 12, No. 10, Oct. 1991, pp. 521-523.

Affiliated with

Also associated with

Rating

Method of evaluating semiconductor device without electrical inf does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of evaluating semiconductor device without electrical inf, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of evaluating semiconductor device without electrical inf will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2251993