Image analysis – Applications – Manufacturing or product inspection
Patent
1998-06-01
2000-12-12
Mehta, Bhavesh
Image analysis
Applications
Manufacturing or product inspection
382152, 348131, G06K 900
Patent
active
061609064
ABSTRACT:
A pickup tool (30) has reflective surfaces (42, 44, 46, 48) attached thereto. The pickup tool (30) picks up an object (38) and moves the object (38) over a light source (51). The reflective surfaces (42, 44, 46, 48) reflect a light beam (61) emitted from the light source (51), generating deflected light beams (63, 65, 67, 69) which back light the object (38). The deflected light beams (63, 65, 67, 69) form silhouette images of the object (38) in cameras (52, 54, 56, 58). A visual inspection of the object (38) is performed by analyzing the images.
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LeBeau Christopher John
Lehnen David Charles
Twine Tonya Marie
Martinez Anthony M.
Mehta Bhavesh
Motorola Inc.
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