Test pattern generator

Details Test pattern generator Test pattern generator

1986-10-14

1989-08-29

Fleming, Michael R.

Excavating

G01R 3128

Patent

active

048624608

ABSTRACT:
A test pattern generator includes: an algorithmic pattern generator, a sequential pattern generator, a selector for selecting one of an algorithmic pattern and a sequential pattern for use with a specified pin of an object device to be tested; and a pattern controller for controlling the selector, whereby data to be supplied to a pin or pin block can be assigned in real time by the pattern controller.

REFERENCES:
patent: 4389723 (1983-06-01), Nigorikawa
patent: 4547861 (1985-10-01), Lauiron
patent: 4555663 (1985-11-01), Shimizu
patent: 4639919 (1987-01-01), Chang
patent: 4670879 (1987-06-01), Okino
"Model GR18, General Purpose Complex VLSI Test System, Standard Product Description and Specification", 10/84.

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