Via filling by single crystal aluminum

Fishing – trapping – and vermin destroying

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437105, 437203, 437194, 156DIG61, 156DIG103, 156610, H01L 21285, H01L 21283

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active

052623610

ABSTRACT:
A method for forming single crystal aluminum films 14 on the surface of a substrate 12 (e.g. silicon {111} or Si{111}) is presented, comprising the steps of cleaning the substrate, then maintaining the substrate at certain temperature and pressure conditions while electrically neutral aluminum is deposited by a vacuum evaporation technique. Novel structures wherein single crystal aluminum contacts 20 fill via holes 18 in insulating layers 16 are presented. Novel structures wherein a single crystal aluminum film 14 exists on a substrate comprised of more than one crystalline material 12, 22 are presented.

REFERENCES:
patent: 3929527 (1975-12-01), Chang et al.
patent: 4325776 (1982-04-01), Menzel
patent: 4554030 (1985-11-01), Haisma et al.
Yamada, "Recent Progress in Depositing Epitaxial Metal Films by an Ionized Cluster Beam", Nuclear Instruments & Methods in Physics Research B, vol. B55, No. 1/4, Apr. 11, 1991, pp. 544-549.
Niva et al., "Epitaxial Growth of AL On SI(001) by Sputtering", Applied Physics Letters, vol. 59, No. 5, Jul. 29, 1991, pp. 543-545.
Thangaraj et al., "Epitaxial Growth of (001)AL On (100)SI by Vapor Deposition", Applied Physics Letters, vol. 61, No. 1, Jul. 6, 1992, pp. 37-39.
Yahashi, et al., Applied Surface Science (1985) vol. 43 No. 1-4 Dec. 1989 Abstract.
Yamada, et al., Conference on Solid State Devices and Materials (1985) Abstract.
C.-C. Cho, et al., "Low Temperature Epitaxial Growth of Al on Si(111) and CaF.sub.2 (111) Using Molecular Beam Epitaxy", Mat. Res. Soc. Proc., pp. 87-92, vol. 221, 1991.
C.-H. Choi, et al., "Epitaxial Growth of Al(111) Si(111) Films Using Partially Ionized Beam Deposition", Applied Physics Letter, pp. 1992-1994, 51 (24), Dec. 14, 1987.
Shoso Shingubara, et al., "Electromigration in a Single Crystalline Submicron Width Aluminum Interconnection", Applied Physics Letter, pp. 42-44, (1), Jan. 7, 1991.
F. K. LeGoues, et al. "Atomic Structure of the Epitaxial Al-Si Interface", Philosophical Magazine A, pp. 833-841, vol. 53, No. 6, 1986.
F. K. LeGoues, et al., "Atomic Structure of the Epitaxial Al/Si Interface", Mat. Res. Soc. Symp. Proc., pp. 395-400, vol. 37, 1985.
A. S. Ignat'ev, et al. "Auger Electron Spectroscopy of an Aluminum-Silicon System", Sov. Tech. Phys. Lett., pp. 174-175, 8(4), Apr. 1982.
Isao Yamada, "Metallization by Ionized Cluster Beam Deposition", IEEE Transactions on Electron Devices, pp. 1018-1025, vol. ED-34, No. 5, May 1987.

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