Impurity doping method with adsorbed diffusion source

Fishing – trapping – and vermin destroying

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437939, 437950, H01L 21225

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055277330

ABSTRACT:
For effecting impurity doping, a chemically active semiconductor surface is covered with an adsorption layer composed of an impurity element which forms a dopant in the semiconductor or composed of a compound containing the impurity element. Thereafter, solid phase diffusion is effected using the adsorption layer as an impurity diffusion source so as to form an impurity-doped region having a desired density profile in the depth direction.

REFERENCES:
patent: 3247032 (1966-04-01), Griswold
patent: 3506508 (1970-04-01), Nickl
patent: 4151008 (1979-04-01), Kirkpatrick
patent: 4242691 (1980-12-01), Kotani et al.
patent: 4395433 (1983-07-01), Nagakubo et al.
patent: 4441932 (1984-04-01), Akasaka et al.
patent: 4465529 (1984-08-01), Arima et al.
patent: 4737471 (1988-04-01), Shirato et al.
patent: 4791074 (1988-12-01), Tsunashima et al.
patent: 4855258 (1989-08-01), Allman et al.
patent: 4861729 (1989-08-01), Fuse et al.
patent: 4940505 (1990-07-01), Schachameyer et al.
patent: 4951601 (1990-08-01), Maydan et al.
Wolf, "Silicon Processing for the VLSI Era, vol. 1: Process Technology", 1986, pp. 133-136, 264-265.
"Ultrashallow, High Doping of Boron using Molecular Layer Doping", by Nishizawa; Applied Physics Letters; 56 (1990) 2 Apr., No. 14.
"Metal-oxide-Silicon Field-Effect Transistor Made by Means of Solid-Phase Doping", by Gong et al.; J. Appl. Phys. 65 (11), 1 Jun. 1989.
Nishizawam, Jun-ichi, "Simple-Structured PMOSFET Fabricated using Molecular Layer Doping", 8179 IEEE Electron Device Letters, Mar. 11, 1990, pp. 105-106.
Leung, D. L., et al., "CMOS Devices Fabricated in Thin Epitaxial Silicon On Oxide", 1989, IEEE SOS/SOI Technology Conference, Oct., 1989, pp. 74-75.
English Translation of Ito-63-166220 (Japan).
Wolf, et al., "Silicon Processing for the VLSI Era", p. 198, 1986.
Gorkum et al., "Controlled Atomic Layer Doping and ALD MOSFET Fabrication in Si", Jpn. Jnl. of Appl. Phys. vol. 26, No. 12, pp. L1933-L1936, Dec. 1987.
S. K. Ghandhi, VLSI Fabrication Principles, pp. 214-216, 1983.
"UV epitaxy applied to make transistor", Nikkei High Tech Report, vol. 4, No. 4, 13 Feb. 1989, p. 10.
Excerpt from Patent Abstracts of Japan, vol. 12, No. 430, Japanese patent No. 63-166220 Jul. 9, 1988.
"Doping reaction fo PH3 and B2H6 with Si(100)", Journal of Applied Physics, vol. 59, No. 12, Jun. 1986, pp. 4032-4037, American Institute of Physics.

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