X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1984-01-23
1988-02-16
Fields, Carolyn E.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 79, 378 81, G01N 23207
Patent
active
047260475
ABSTRACT:
In an X-ray analysis apparatus, a specimen to be examined is mounted on the circumference of a focusing cylinder, which can be rolled along an auxiliary cylinder arranged concentrically around the beam focus of an X-ray beam. Independently of the movement mechanism used, a fixed part of the specimen then remains continuously in the beam path. Invariably the same surface area of the specimen is irradiated by the X-ray beam. The movement mechanism may have added to it a device by means of which during the movement of the specimen and the detector the detector is continuously optimally directed to the specimen. The specimen holder may have added to it a device for rotating and/or tilting a specimen included therein.
REFERENCES:
patent: 4274000 (1981-06-01), Goebel
Dachs et al., "Guiner Camera for Single Crystal Investigation", Journal of Applied Crystalography (1972), vol. 5, pp. 338-342.
Brouwer Geert
Wadman Sipke
Fields Carolyn E.
Miller Paul R.
U.S. Philips Corporation
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