Optical wavefront analyzer and method using a single wave shifte

Details Optical wavefront analyzer and method using a single wave shifte Optical wavefront analyzer and method using a single wave shifte

1999-01-22

2000-09-05

Kim, Robert H.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

G01B 902

Patent

active

061151262

ABSTRACT:
An optical wavefront analyzer based on the phase-shearing interferometry technique for measuring a wavefront of a light beam is disclosed. The analyzer includes a single phase shifter, a driving device, a pattern receiving device, and a phase reconstructing device. A method of measuring a wavefront of a light beam is also provided for solving the problems of two-axial focusing and phase inconsistency encountered the prior art by employing phase-shearing and phase-shifting techniques to improve the method of optical wavefront mesurement. A non-iterative, path-independent unwrapping methodology is used to deal with a complicated wavefront.

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M.P. Rimmer; "Method for Evaluating Lateral Shearing Interferograms;" Applied Optics; vol. 13, No. 3 (Mar. 1974).

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