Radiant energy – Ionic separation or analysis – With sample supply means
Patent
1999-04-27
2000-09-05
Berman, Jack
Radiant energy
Ionic separation or analysis
With sample supply means
H01J 4910
Patent
active
061146935
ABSTRACT:
A mass spectrometer comprising a passage through which a sample solution flows, the passage including a capillary having an open tip, the sample solution flowing through the capillary out of the open tip of the capillary, a gas passage which forms a gas flow around the open tip of the capillary, the gas flow spraying the sample solution flowing out of the open tip of the capillary, a first electrode which contacts the sample solution flowing in the passage and applies an electric potential to the sample solution flowing in the passage, a second electrode disposed around the capillary near the open tip of the capillary, the second electrode being downstream from the first electrode with respect to a direction in which the sample solution flows in the passage, there being no gap extending downstream from the open tip of the capillary to the second electrode in a direction in which the sample solution flows out of the open tip of the capillary, the second electrode being electrically isolated from the sample solution flowing in the capillary and applying an electric field to the sample solution flowing in the capillary, and an analyzer which analyzes a mass of gaseous ions formed from the sample solution sprayed by the gas flow.
REFERENCES:
patent: 4298795 (1981-11-01), Takeuchi et al.
patent: 4300044 (1981-11-01), Iribarne et al.
patent: 4861988 (1989-08-01), Henion et al.
patent: 4935624 (1990-06-01), Henion et al.
patent: 4977785 (1990-12-01), Willoughby et al.
patent: 5122670 (1992-06-01), Mylchreest et al.
patent: 5130538 (1992-07-01), Fenn et al.
patent: 5170052 (1992-12-01), Kato
patent: 5170053 (1992-12-01), Hail et al.
patent: 5223226 (1993-06-01), Wittmer et al.
patent: 5306412 (1994-04-01), Whitehouse et al.
patent: 5306910 (1994-04-01), Jarrell et al.
patent: 5349186 (1994-09-01), Ikonomou et al.
patent: 5376789 (1994-12-01), Stenhagen
patent: 5423964 (1995-06-01), Smith et al.
patent: 5559326 (1996-09-01), Goodley et al.
Hirabayashi et al., "Sonic Spray Ionization Method for Atmospheric Pressure Ionization Mass Spectrometry", Analytical Chemistry, vol. 66, No. 24, pp. 4557-4559, Dec. 1994.
M. Ikonomou et al., "Electrospray--Ion Spray: A Comparison of Mechanisms and Performance", Analytical Chemistry, vol. 63, No. 18, Sep. 15, 1991, pp. 1989-1998.
U.S. application No. 09/328,664 filed on Jun. 9, 1999.
B. Thomson et al., "Field induced ion evaporation from liquid surfaces at atmospheric pressure", Journal of Chemical Physics, vol. 71, No. 11, Dec. 1, 1979, pp. 4451-4463.
H. Kambara, "Sample Introduction System for Atmospheric Pressure Ionization Mass Spectrometry of Nonvolatile Compounds", Analytical Chemistry, vol. 54, No. 1, Jan. 1982, pp. 143-146.
M. Yamashita et al., "Electrospray Ion Source. Another Variation on the Free-Jet Theme", Journal of Physical Chemistry, vol. 88, No. 20, 1984, pp. 4451-4459.
A. Bruins et al., "Ion Spray Interface for Combined Liquid Chromatography/Atmospheric Pressure Ionization Mass Spectrometry", Analytical Chemistry, vol. 59, No. 22, Nov. 15, 1987, pp. 2642-2646.
A. Cappiello et al., "Micro Flow Rate Particle Beam Interface for Capillary Liquid Chromatography/Mass Spectrometry", Analytical Chemistry, vol. 65, No. 9, May 1, 1993, pp. 1281-1287.
P. Kebarle et al., "From Ions in Solution to Ions in the Gas Phase--The Mechanism of Electrospray Mass Spectrometry", Analytical Chemistry, vol. 65, No. 22, Nov. 15, 1993, pp. 972 A-974 A.
A. Bruins, "Atmospheric-pressure-ionization mass spectrometry--II. Applications in pharmacy, biochemistry and general chemistry", Trends in Analytical Chemistry, vol. 13, No. 2, 1994, pp. 81-90.
A. Hirabayashi et al., "Sonic Spray Ionization Method for Atmospheric Pressure Ionization Mass Spectrometry", Analytical Chemistry, vol. 66, No. 24, Dec. 15, 1994, pp. 4557-4559.
M. Wilm et al., "Electrospray and Taylor-Cone theory, Dole's beam of macromolecules at last?", International Journal of Mass Spectrometry and Ion Processes, vol. 136, Nos. 2/3, Sep. 22, 1994, pp. 167-180.
U.S. application No. 08/404,615 filed on Mar. 15, 1995.
U.S. application No. 08/783,089 filed on Jan. 14, 1997.
Hirabayashi Atsumu
Hirabayashi Yukiko
Koizumi Hideaki
Nabeshima Takayuki
Sakairi Minoru
Berman Jack
Hitachi , Ltd.
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