Fishing – trapping – and vermin destroying
Patent
1993-04-19
1995-01-03
Hearn, Brian E.
Fishing, trapping, and vermin destroying
437100, 437911, H01L 21266
Patent
active
053786424
ABSTRACT:
A silicon carbide (SiC) junction field effect transistor (JFET) device is fabricated upon a substrate layer, such as a p type conductivity SiC substrate, using ion implantation for the source and drain areas. A SiC p type conductivity layer is epitaxially grown on the substrate. A SiC n type conductivity layer is formed by ion implantation or epitaxial deposition upon the p type layer. The contacting surfaces of the p and n type layers form a junction. A p+ type gate area supported by the n type layer is formed either by the process of ion implantation or the process of depositing and patterning a second p type layer. The source and drain areas are heavily doped to n+ type conductivity by implanting donor ions in the n type layer.
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"Nitrogen-Implanted SiC Diodes Using High-Temperature Implantation" by Mario Ghezzo, et al, IEEE Electron Device letters, vol. 13, No. 12, Dec. 1992.
"Epitaxial Deposition of Silicon Carbide from Silicon Tetrachloride and Hexane" by W. V. Muench, et al, Thin Solid Films, 31 (1976), pp. 39-51.
Brown Dale M.
Ghezzo Mario
Chaudhari Chandra
General Electric Company
Hearn Brian E.
Kratz Ann M.
Snyder Marvin
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