Sub-nyquist interferometry

Details Sub-nyquist interferometry Sub-nyquist interferometry

1986-10-15

1988-12-13

Lall, Parshotam S.

Boots, shoes, and leggings

356359, 356360, G01B 902

Patent

active

047915846

ABSTRACT:
A technique is described for extending the measurement range of interferometry past the Nyquist limit of the sampling frequency of the interferogram. The absolute phase values measured by an interferometer are reconstructed by applying constraints based upon a priori knowledge of the absolute phase values. The constraints include the knowledge that one or more derivatives of the spatial distribution of phase values is a continuous function, and the knowledge of step heights to within .lambda./2.

REFERENCES:
patent: 3917926 (1975-11-01), Gerard et al.
patent: 3936160 (1976-02-01), Von Bieren
patent: 4169980 (1979-10-01), Zanoni
patent: 4188122 (1980-02-01), Massie et al.
patent: 4346999 (1982-08-01), Massie
patent: 4583855 (1986-04-01), Bareket
patent: 4594003 (1986-06-01), Sommargren
patent: 4611915 (1986-09-01), Gillard et al.
patent: 4624569 (1986-11-01), Kwon
patent: 4639139 (1987-01-01), Wyant et al.
patent: 4640618 (1987-02-01), Tracy et al.
patent: 4687332 (1987-08-01), Baveket
patent: 4697927 (1987-10-01), Ono
"Direct Phase Measurement of Aspheric Surface Contours," by K. Creath and J. C. Wyant.

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