Method for locating weft thread defects in fabric

Facsimile and static presentation processing – Facsimile – Specific signal processing circuitry

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358107, 26 70, 356238, 356431, 139291R, 139 1R, H04N 700

Patent

active

047914815

ABSTRACT:
A process for locating weft thread defects in woven fabrics includes using a macro (close-up) lens and video camera to produce an enlarged image of the fabric, and then observing and evaluating the weft pattern from the video generated image. Transmissive and reflecting illumination may be used on the fabric to enhance the video image. Evaluation and measurement of weft thread positions is carried out by direct visual observation or by using computerized pattern recognition systems with micro processor techniques involving digitizing the video image. A relaxation defect of weft thread is determined by measuring variation between weft thread spacing when the fabric is viewed from two different viewing angles.

REFERENCES:
patent: 2935559 (1960-05-01), Dornier
patent: 2984699 (1961-05-01), Dornier
patent: 4582095 (1986-04-01), Kronholm
patent: 4583181 (1986-04-01), Gerber et al.

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