Testing apparatus for testing and handling a multiplicity of dev

Details Testing apparatus for testing and handling a multiplicity of dev Testing apparatus for testing and handling a multiplicity of dev

1994-08-30

1996-06-25

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

364489, 324 731, G01R 3102, G01R 3128

Patent

active

055303706

ABSTRACT:
A testing apparatus for testing and handling a multiplicity of devices, in particular electronic components such as integrated circuits or boards, comprises a test executor with a multiplicity of hierarchical operating levels assigned to respective physical or logical entities. At each level except the lowest one, test level controllers are provided which include a pre-activity sequence of tasks, a call to a lower operating level, a return from said lower operating level, and a post-activity sequence of tasks. At the lowest level, device test processors execute the actual test.

REFERENCES:
patent: 4218745 (1980-08-01), Perkins
patent: 5023791 (1991-06-01), Herzberg et al.

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