Gas evolution component analysis

Radiant energy – Ionic separation or analysis – With sample supply means

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250282, 7386312, 7386483, H01J 4904

Patent

active

054421756

ABSTRACT:
A method and apparatus for analyzing chemical compounds on a surface, such as the surface of a semiconductor wafer, comprising: a heater component for volatilizing the chemical compounds from the surface and capturing said volatilized compounds, a condensation surface having a hot end and a cold end and a thermal gradient therebetween, means for causing said volatilized chemical compounds to flow along said condensing surface so as to sequentially condense said chemical compounds and an exciter/analyzer for sequentially analyzing said condensed chemical compounds. The exciter/analyzer can comprise an ion beam, laser, or similar exciting device, coupled with a mass analyzer. The exciter/analyzer preferably scans the condensing surface from the hot end to the cold end and withdraws molecules for analysis as they are excited from the surface.

REFERENCES:
patent: 4259572 (1981-03-01), Brunnee et al.
patent: 5191211 (1993-03-01), Gorman
McGee et al., The Review of Scientific Instruments, vol. 37, No. 5, May 1966, pp. 561-566.

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