Surface acoustic wave transducer

Details Surface acoustic wave transducer Surface acoustic wave transducer

1974-02-25

1976-09-07

Gill, James J.

Measuring and testing

Speed, velocity, or acceleration

With means for retaining reading

73DIG4, G01L 900, G01L 1100

Patent

active

039787311

ABSTRACT:
Surface acoustic waves are propagated across a thin, flexible diaphragm which is subjected to an applied external pressure. Since the wave velocity and path length vary with diaphragm deformation, the acoustic wave delay time is a function of the applied external pressure. Electroacoustic transducers are fabricated on opposite edges of the diaphragm for electronic excitation and detection of the surface acoustic wave. An electronic feedback path including the two transducers, the wave path, and an electronic amplifier oscillates at a frequency which is determined by the delay time required for acoustic wave propagation over the diaphragm path, and which decreases approximately linearly with applied external pressure. A second acoustic path called the reference path has a length equal to the first path and in the preferred embodiment contains a diaphragm which is subject to a different applied pressure. A second electronic feedback path composed of two transducers, the reference path and a second amplifier oscillates at a second frequency called the reference frequency. By applying a sample of the first and second oscillator voltages to a semiconductor mixer, a difference frequency output is obtained which is proportional to the differential pressure. The difference frequency output is approximately independent of temperature, and is easily converted to various digital codes by use of standard frequency counter circuits. If only one set of transducers is used, the device can also measure temperature in a digital manner. By adding a mass load to the center of the diaphragm, acceleration may be measured. Stress or strain measurements may also be made by bonding the diaphragms or only the transducers directly on the physical surface to be measured.

REFERENCES:
patent: 2938386 (1960-05-01), Anderson et al.
patent: 3241373 (1966-03-01), Ricketts et al.
patent: 3513430 (1970-05-01), Heller
patent: 3575050 (1971-04-01), Lynnworth
patent: 3580057 (1971-05-01), Seegmiller
patent: 3723915 (1973-03-01), Adler et al.
patent: 3812709 (1974-05-01), Benson et al.
patent: 3848144 (1974-11-01), Schissler
patent: 3863497 (1975-02-01), vandeVaart et al.

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