Method of making implant programmable N-channel read only memory

Metal working – Method of mechanical manufacture – Assembling or joining

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

29576B, 148 15, 148187, 357 41, 357 59, 357 91, H01L 21425, G11C 1140

Patent

active

043366473

ABSTRACT:
An MOS read only memory or ROM formed by the standard N-channel silicon gate manufacturing process uses a cell structure which allows implant programming after the metal level of contacts and interconnections has been deposited and patterned. Address lines and gates are polysilicon strips and output and ground lines are metal strips perpendicular to the address lines; these metal strips make contact to the sources and drains defined by N+ regions. Each potential MOS transistor in the array is programmed to be a logic "1" or "0" by selective ion implant through the polysilicon gates and thin gate oxide, using photoresist as a mask, after application of the metal level. The ion implant is not required to penetrate through the metal lines.

REFERENCES:
patent: 4080718 (1978-03-01), Richman
patent: 4129936 (1978-12-01), Takei
patent: 4176442 (1979-12-01), Bischoff et al.
patent: 4180826 (1979-12-01), Shappir
patent: 4208780 (1980-06-01), Richman
patent: 4230504 (1980-10-01), Kuo
patent: 4235010 (1980-11-01), Kawagoe
patent: 4257826 (1981-03-01), Matalone, Jr.
patent: 4257832 (1981-03-01), Schwabe et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of making implant programmable N-channel read only memory does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of making implant programmable N-channel read only memory, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of making implant programmable N-channel read only memory will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2160534

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.