Pin test circuit for semiconductor test system

Details Pin test circuit for semiconductor test system Pin test circuit for semiconductor test system

1995-12-22

1997-06-17

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

3241581, G01R 3128, G01R 104, H05K 105

Patent

active

056401027

ABSTRACT:
The present invention provides a cost effective and compact pin test circuit for non-connection pins of the semiconductor device under test. The pin test circuit includes a plurality of exclusive DC channels each of which has a flirt relay controlled by a control signal for switching ON/OFF a power source which generates a predetermined voltage, and a second relay controlled by a control signal switching ON/OFF a fixed electric potential such as a ground level electric potential. The exclusive DC channel is used for the NC pin testing and connected to each of the NC pins which are divided into two groups. The exclusive DC channels are used to determine whether or not the NC pins form an electrical short circuit each other by connecting one NC pin to a ground level and while connecting the other NC pin to the power source having the DC measurement function.

REFERENCES:
patent: 4724379 (1988-02-01), Hoffman
patent: 5386199 (1995-01-01), Nishimura et al.

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