Method and apparatus for surface roughness detection - using a m

Details Method and apparatus for surface roughness detection - using a m Method and apparatus for surface roughness detection - using a m

1995-09-11

1997-06-17

Strecker, Gerard R.

Electricity: measuring and testing

Magnetic

Magnetic information storage element testing

73105, 324235, 324252, G01B 734, G01R 3312, G01N 2772

Patent

active

056400896

ABSTRACT:
A magnetoresistive element is used to detect a surface roughness of an object, such as a magnetic recording medium, a photomask blank, a semiconductor wafer, and is assembled into a reproducing head which moves along a surface of the object and which can produce an electric signal related to the surface roughness. The reproducing head may be incorporated with a recording head into a head unit. The head unit can monitor a magnetic characteristic of the magnetic recording medium in addition to detection of the surface roughness, by recording a predetermined signal by the recording head and by reproducing the predetermined signal by the reproducing head.

REFERENCES:
patent: 4416144 (1983-11-01), Chen et al.
patent: 4532802 (1985-08-01), Yeack-Scranton et al.
patent: 5410439 (1995-04-01), Egbert et al.
patent: 5455730 (1995-10-01), Dovek et al.

Affiliated with

Also associated with

Rating

Method and apparatus for surface roughness detection - using a m does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for surface roughness detection - using a m, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for surface roughness detection - using a m will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2160391