Defect detection method and apparatus for active matrix substrat

Details Defect detection method and apparatus for active matrix substrat Defect detection method and apparatus for active matrix substrat

1995-04-18

1997-03-04

Sikes, William L.

Liquid crystal cells, elements and systems

Nominal manufacturing methods or post manufacturing...

Defect correction or compensation

324770, G02F 11343

Patent

active

056085583

ABSTRACT:
According to the present invention, a defect detection method for at least one of an active matrix substrate and an active matrix liquid crystal panel is provided. The active matrix substrate includes: an insulating substrate; a plurality of pixel electrodes arranged in a matrix fashion on the substrate; switching elements for driving the plurality of pixel electrodes; and scanning lines and signal lines which are respectively connected to the switching elements and are formed so as to be crossed with each other, while the active matrix liquid crystal panel includes: the active matrix substrate; a counter substrate provided with counter electrodes thereon and disposed so as to be opposed to the active matrix substrate; and a liquid crystal layer interposed between the active matrix substrate and the counter substrate. In accordance with the method of the invention, a voltage signal having a voltage level higher than that of a commonly used driving voltage is applied to a portion between the scanning lines and the signal lines of the active matrix substrate so as to detect the defects.

REFERENCES:
patent: 5175504 (1992-12-01), Henley
patent: 5432461 (1995-07-01), Henley
patent: 5459410 (1995-10-01), Henley
U.S. Appl. No. 08/158,843, filing date Nov. 24, 1993, Kondo et al., pending .

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