Atomic-level imaging, processing and characterization of semicon

Details Atomic-level imaging, processing and characterization of semicon Atomic-level imaging, processing and characterization of semicon

1993-07-01

1995-08-22

Dzierzynski, Paul M.

Radiant energy

Irradiation of objects or material

Ion or electron beam irradiation

250306, 250207, H01J 3730

Patent

active

054442605

ABSTRACT:
A method for selecting and removing single specific atoms from a solid material surface uses photon biasing to break down bonds that hold the selected atom in the lattice and to reduce barrier effects that hold the atom from transferring to a probe. The photon bias is preferably light or other electromagnetic radiation with a wavelength and frequency that approximately matches the wave function of the target atom species to be removed to induce high energy, selective thermionic-like vibration. An electric field potential is then applied between the probe and the surface of the solid material to pull the atom out of the lattice and to transfer the atom to the probe. Different extrinsic atoms can be installed in the lattice sites that are vacated by the removed atoms by using a photon bias that resonates the extrinsic atom species, reversing polarity of the electric field, and blowing gas comprising the extrinsic atoms through a hollow catheter probe.

REFERENCES:
patent: 4292093 (1981-09-01), Ownby et al.
patent: 4327477 (1982-05-01), Yaron et al.
patent: 4343993 (1982-08-01), Binnig et al.
patent: 4680616 (1987-07-01), Delahoy et al.
patent: 4774195 (1988-09-01), Beneking
patent: 4874711 (1989-10-01), Hughes et al.
patent: 4918309 (1990-04-01), Beha et al.
patent: 4942299 (1990-07-01), Kazmerski
patent: 5116782 (1992-05-01), Yamaguchi et al.
patent: 5144148 (1992-09-01), Eigler

Affiliated with

Also associated with

Rating

Atomic-level imaging, processing and characterization of semicon does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Atomic-level imaging, processing and characterization of semicon, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Atomic-level imaging, processing and characterization of semicon will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2143350