Removal of extended bond pads using intermetallics

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Wire contact – lead – or bond

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257737, 257786, 257781, 257673, H01L 2348, H01L 2954, H01L 23485

Patent

active

058864148

ABSTRACT:
Removable extension areas electrically connected to the original die bond pad allow for testing connections to be made. After removal of the extension areas, the circuitry below the region of the extension areas can be seen through a microscope. The use of perforations and/or underlayer sections can aid in the removal of the extension areas. Underlayer sections may comprise a metal that forms an intermetallic interaction with the metal layer of the extension areas.

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