Logic integrated circuit capable of simplifying a test

Details Logic integrated circuit capable of simplifying a test Logic integrated circuit capable of simplifying a test

1987-12-28

1989-12-12

Fleming, Michael R.

Excavating

371 224, G06F 1100

Patent

active

048872679

ABSTRACT:
A logic integrated circuit includes a FIFO type memory circuit provided for testing. A logic value at each test node is stored in the memory circuits during a write-in enable period set by a control signal from a flip-flop or an externally supplied control signal, and the memory data is read out from the memory circuits, to trace the output states of internal bus, register, multiplier, and the like.

REFERENCES:
patent: 4194113 (1980-03-01), Fulks
patent: 4510572 (1985-04-01), Reece
patent: 4779042 (1988-10-01), Ugenti
patent: 4788492 (1988-11-01), Schubert
Eichelberger et al., "A Logic Design Structure for LSI Testability," Proc. Design Automation Workshop 14th, pp. 462-468, ('77).

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