Electricity: measuring and testing – Plural – automatically sequential tests
Patent
1985-10-23
1987-10-06
Karlsen, Ernest F.
Electricity: measuring and testing
Plural, automatically sequential tests
324158R, 371 25, G01R 3128, G06F 1100
Patent
active
046985883
ABSTRACT:
A transparent shift register latch (170) includes a normal operating gate (182) and a test gate (184) for selectively connecting data to a node (180). The node (180) is input to an isolation gate (186) through an inverter (188) for connection to an output node (190). A peripheral port (172) is interfaced with the output node (190) through an isolation gate (192). The gates (186) and (192) are operable in a test mode to interface data stored on the node (180) with the output of the latch (170) and inhibit input of data from the port (172). In the normal operating mode, the isolation gate (192) is closed and the isolation gate (186) is opened. The transparent shift register latch (170) allows testing of interface lines between adjacent logic modules.
REFERENCES:
patent: 4428060 (1984-01-01), Blum
patent: 4503537 (1985-03-01), McAnney
patent: 4519078 (1985-05-01), Komonytsky
patent: 4575674 (1986-03-01), Bass et al.
E. J. McCluskey; "A Survey of Design for Testability Scan Techniques"; VLSI Design; Dec. 1984; pp. 36-61.
Hwang Yin-Chao
Powell Theo J.
Anderson Rodney M.
Graham John G.
Karlsen Ernest F.
Nguyen Vinh P.
Texas Instruments Incorporated
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