Thermal wave imaging apparatus

Details Thermal wave imaging apparatus Thermal wave imaging apparatus

1984-04-04

1986-05-20

Yasich, Daniel M.

Thermal measuring and testing

Thermal testing of a nonthermal quantity

250334, 356128, 374 6, 374128, G01N 2100, G01N 2500

Patent

active

045897832

ABSTRACT:
A thermal wave imaging apparatus generates a real time image of the surface and subsurface of an opaque solid object. A.C. electrical signals indicative of the configuration of the surface and subsurface of the object which are generated during a thermal wave scan of the object by a first heating beam which generates a localized temperature gradient on the object and a deflectable second probe beam heating beam, which deflection is detected by a detection device mounted adjacent to the object, are stored in an image memory under the control of a central processor. A refresh counter generates sequential, incremental signals used to control the X and Y axis deflection of a display monitor. Such signals also address the image memory and generate output data controlling the intensity of the display point at each generated X and Y axis deflection point. A modulation and intensity regulation circuit generates an optical beam having a constant amplitude in spite of any fluctuations in the output of the heating laser.

REFERENCES:
patent: 3233450 (1966-02-01), Fry
patent: 3903498 (1975-09-01), Jacobs et al.
patent: 3948345 (1976-04-01), Rosencwaig
patent: 3978713 (1976-09-01), Penney
patent: 4006444 (1977-02-01), Quate et al.
patent: 4011748 (1977-03-01), Bond et al.
patent: 4012950 (1977-03-01), Kompfner et al.
patent: 4012951 (1977-03-01), Kessler
patent: 4028933 (1977-06-01), Lemons et al.
patent: 4028937 (1977-06-01), Crano
patent: 4129385 (1978-12-01), Rosencwaig et al.
patent: 4184768 (1980-01-01), Murphy et al.
patent: 4246793 (1981-01-01), Fairand et al.
patent: 4255971 (1981-03-01), Rosencwaig
patent: 4267732 (1981-05-01), Quate
patent: 4282511 (1981-08-01), Southgate et al.
patent: 4298807 (1981-11-01), Farre
patent: 4299494 (1981-11-01), Badoz et al.
patent: 4330205 (1982-05-01), Murakami et al.
patent: 4378699 (1983-04-01), Wickramasinghe
patent: 4394824 (1983-07-01), Kanda et al.
patent: 4468136 (1984-08-01), Murphy et al.
"Microelectronics" Jacob Millman, Ph.D., pp. 405-406, .COPYRGT.1979.
P. K. Kuo--Experimental and Theoretical Characterization of Near Surface Cracks in Solids by Photoacoustic Microscopy--1981--entire work.
Robert L. Thomas et al.-Thermal Wave Imaging for Nondestructive Evaluation--1982--entire work.
P. K. Kuo et al.,--Photoacoustic Phase Signatures of Closed Cracks--1981--entire work.
L. J. Inglehart--Photoacoustic Microscopy of Ceramic Engine Hardware--1980--entire work.
K. R. Grice et al.,--Evaluation of Thermal Wave Microscopy for Detection of Fatigue Cracks in Flat Metal Samples and Bolt Holes--1983--entire work.
L. J. Inglehart--Spatial Resolution of Thermal Wave Microscopes--Jun. 13, 1983--entire work.
L. J. Inglehart--Scanning Photoacoustic Microscopy--1982--entire work.
K. R. Grice et al.--Thermal Wave Imaging of Cracks in Metals--Oct., 1983--C6-519-C6-524.
K. R. Grice et al.,--Thermal Wave Imaging of Closed Cracks in Opaque Solids--Jul. 14, 1983--entire work.
L. D. Favro et al.--Thermal Wave Imaging for Nondestructive Evaluation--1983--entire work.

Affiliated with

Also associated with

Rating

Thermal wave imaging apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Thermal wave imaging apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Thermal wave imaging apparatus will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2106066