System having multiple subsystems and test signal source residen

Details System having multiple subsystems and test signal source residen System having multiple subsystems and test signal source residen

1995-05-18

1996-03-12

Ramirez, Ellis B.

Excavating

364574, H04B 116

Patent

active

054992508

ABSTRACT:
A system has multiple subsystems and a test signal source resident upon a common substrate. A first subsystem interfaces with an off-substrate functional tester during a test. The test signal source generates a first signal during the test for input to the second subsystem. The second subsystem responds performing an operation independent of operation and current state of the first subsystem. The functional tester verifies the independent operation of the first and second subsystems.

REFERENCES:
patent: 4701920 (1987-10-01), Resnick et al.
patent: 4914379 (1990-04-01), Maeno
patent: 4931722 (1990-06-01), Stoica
patent: 5150047 (1992-09-01), Saito et al.
patent: 5301156 (1994-04-01), Talley

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