System for measuring timing relationship between two signals

Details System for measuring timing relationship between two signals System for measuring timing relationship between two signals

1993-01-15

1996-03-12

Cosimano, Edward R.

Boots, shoes, and leggings

324621, 364569, 371 1, G04F 1302

Patent

active

054991900

ABSTRACT:
A system for measuring timing relationship between two signals for accurately measuring a timing relationship between signals includes an electro-optic measuring unit and a waveform storage and processing unit. The electro-optic measuring unit samples electrical signals from a device under measurement via a strobe light so as to measure the signal waveform. The electro-optic unit uses a laser diode as a light source. The waveform storage and processing unit stores the electrical signal waveforms measured by the electro-optic measuring unit in digital form. The waveform storage and processing unit also calculates a correlation between two stored electrical signal waveforms via a correlation calculation unit, and also detects a peak of the correlation to detect a timing relationship between the signals.

REFERENCES:
patent: 2700133 (1955-01-01), Pfleger
patent: 2768348 (1956-10-01), Grumet et al.
patent: 2915700 (1959-12-01), Cartwright
patent: 3157781 (1964-11-01), Gruen
patent: 4703448 (1987-10-01), Muething
patent: 4802486 (1989-02-01), Goodman et al.
patent: 4911167 (1990-03-01), Corenman et al.
patent: 4928692 (1990-05-01), Goodman et al.
patent: 4934372 (1990-06-01), Corenman et al.
Webb, On-Wafer Optoelectronic Characterization of Monolithic Millimeter-Wave Integrated Circuits, Electro, Conf. Record, vol. 14, No. 13/1, Apr. 1989, Los Angeles, pp. 1-6.
Aoshima et al., Non-Contact Picosecond Electro-Optic Sampling with a Semiconductor Laser, T.IEE Japan, vol. 111-C No. 4, 1991, pp. 145-154.
Aoshima et al., Non-contact electro-optic sampling utilizing semiconductor laser pulses, Reprinted from Ultahigh Speed and High Speed Photography, Photonics, and Videography '89, SPIE/The International Society for Optical Engineering, vol. 1155, Aug. 7-9, 1989, San Diego, California, pp. 499-510.
Valdmanis et al., Subpicosecond Electrooptic Sampling: Principles and Applications, IEEE Journal of Quantum Electronics, vol. QE-22, No. 1, Jan. 1986, pp. 69-78.

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