Pellicle reflectivity monitoring system having means for compens

Radiant energy – Photocells; circuits and apparatus – Photocell controls its own optical systems

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Details

25055945, 25055946, 356237, G01N 2188

Patent

active

057171980

ABSTRACT:
A pellicle reflectivity monitoring system comprising a radiation source for directing radiation through a pellicle to an object to be inspected, a sensor device positioned to receive the portion of the radiation reflected by the pellicle, a processor, responsive to the sensor device, for determining the intensity of the portion of the radiation reflected by the pellicle, and a lens assembly, positioned in an optical path between the pellicle and the sensor device, for directing the portion of the radiation reflected by pellicles of different heights onto the sensor device. A comparator device compares the intensity of the radiation directed at the object to be inspected with the intensity of the portion of the radiation reflected by the pellicle and outputs a correction factor based on the comparison in order to compensate for the portion of the radiation reflected by the pellicle.

REFERENCES:
patent: 4999510 (1991-03-01), Hayano et al.
patent: 5072128 (1991-12-01), Hayano et al.
patent: 5416594 (1995-05-01), Gross et al.

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