Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1998-09-09
2000-10-31
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
With light attenuation
G01B 1114
Patent
active
061411043
ABSTRACT:
An optical improvement for angular position sensors, which may be used to determine the spatial coordinates of a small source of light (or other energy) in a 3-dimensional volume. Such sensors normally include a linear photosensitive image detector such as a photodiode array or a charge-coupled device (CCD). An irregular pattern of parallel slits is described which increases the amount of light gathered while avoiding the undesirable characteristics of lens optics for this application. One optimal type of irregular pattern is the uniformly redundant array. A mathematical correlation function together with a polynomial interpolation function can determine the displacement of the image on the detector and thereby the location of the source relative to one angular dimension. Given the locations and orientations of several sensors in a 3-dimensional coordinate system and given the angles measured by each, the location of the point source can be computed.
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patent: 5499098 (1996-03-01), Ogawa
patent: 5502568 (1996-03-01), Ogawa et al.
patent: 5640241 (1997-06-01), Ogawa
Cormack Robert
Schulz Waldean A.
Image Guided Technologies Inc.
Pham Hoa Q.
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