Pattern generator circuit for semiconductor test system

Details Pattern generator circuit for semiconductor test system Pattern generator circuit for semiconductor test system

1997-12-08

1998-12-22

Canney, Vincent P.

Excavating

G06F 1100

Patent

active

058526196

ABSTRACT:
A pattern generator that makes it possible to use various option pattern generators (PGs) without changing hardware is realized. To accomplish this, an option circuit includes an option PG initial clock control section that generates an initial clock signal in synchronism with a clock signal to initialize the option PGs; a plurality of option PGs selectively receive one of a plurality of clock output signals of a clock output control section and generate pattern and clock signals; and in a multiplexer which selects one of output signals from the plurality of PGs through an instruction from a select register 24, and a FIFO section which receives a signal from the multiplexer as write data and a write clock, and an output signal of a read clock control section as a read clock, and outputs a signal to a logic circuit as the option PG output signal.

REFERENCES:
patent: 5602999 (1997-02-01), Hyatt
patent: 5613077 (1997-03-01), Leung et al.

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