Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Patent
1998-11-30
2000-10-03
Hoff, Marc S.
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
702 66, 702 73, 324142, G06F 1900
Patent
active
061285846
ABSTRACT:
A system and method for improving the ability of an electronic meter to make measurements on signals to determine content of different frequencies, and harmonics of the fundamental frequency, of AC signals (voltages and currents). The line frequency is determined and compensated for prior to performing frequency-dependent parameter measurements or determining frequency-dependent parameters.
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patent: 5544089 (1996-08-01), Hemminger
patent: 5548527 (1996-08-01), Hemminger et al.
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Hemminger Rodney C.
Holdsclaw Scott T.
Hubbard Vick A.
ABB Power T&D Company Inc.
Bui Brian
Hoff Marc S.
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