High temperature lift-off process

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Details

437944, 148DIG100, 148DIG75, H01L 21312, H01L 2147

Patent

active

050064886

ABSTRACT:
Disclosed is a process for forming a pattern of metallization on a processed semiconductor substrate, under high temperature conditions, employing a polyimide precursor material as a lift-off layer. Advantageously, the material is photosensitive, and, after exposure and development, the portions of the layer remaining on the substrate can be completely and readily removed with conventional solvents.

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Homma, Y. et al., "Polyimide Lift-Off Technology for High-Density LSI Metallization", IEEE Transactions on Electron Devices, vol. Ed. -28, No. 5 (May 1981), pp. 552-556.
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