Logical comparison circuit for an IC tester

Communications: electrical – Digital comparator systems

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

307440, 307480, 324 7647, 324 7655, 377 39, 377 19, H03K 1900, H03K 1902

Patent

active

052453111

ABSTRACT:
In the case of setting one comparison timing in one operation period, a select signal is set to the "0" level, by which first, second and third counters are each put in the state of operation of a 1-to-4 frequency dividing counter which produces four frequency-divided outputs sequentially displaced apart in phase in a cyclic order. A first comparison clock is frequency divided by the first counter and its four frequency-divided outputs are used to latch a comparison signal in four first latch circuits in a sequential order, by which the comparison signal is demultiplexed and expanded. A first system clock is frequency divided by the second counter down to 1/4 and its four frequency-divided outputs are used to latch an expected value signal in four second latch circuits in a sequential order, by which the expected value signal is demultiplexed and expanded. The corresponding ones of the outputs from the first and second latch circuits are subjected to logical comparison by four comparators. A second system clock is frequency divided by the third counter down to 1/4 and its four frequency-divided outputs are used to time division multiplex the outputs of the four comparators one after another to obtain comparison result data of the same data rate as that of the input comparison signal. With some modification, it is also possible to set two comparison timings in one operational period.

REFERENCES:
patent: 3613082 (1971-10-01), Bouchard
patent: 3622987 (1971-11-01), Borkan
patent: 4001699 (1977-01-01), Denny et al.
patent: 4180797 (1979-12-01), Shimokawa

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Logical comparison circuit for an IC tester does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Logical comparison circuit for an IC tester, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Logical comparison circuit for an IC tester will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2030414

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.