Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1995-05-30
1996-04-02
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324520, 324674, 324707, 437 8, H01L 2166, G01R 3126
Patent
active
055044344
ABSTRACT:
A measurement technique and instrument using rectangular pulse trains of differing repetition rates and synchronously operated lock-in amplifiers to reject electrical noise and capture changes in resistance and capacitance of an electrical element even during a short electrical pulse applied thereto or in the presence of high levels of electrical noise. Particular applications are for electrical programming of fuses and repair of conductors by material deposition.
REFERENCES:
patent: 3155898 (1964-11-01), Chope
patent: 3155900 (1964-11-01), Hanken
patent: 3255412 (1966-06-01), Liu
patent: 3320946 (1967-05-01), Dethloff et al.
patent: 3327207 (1967-06-01), Norwich
patent: 3530379 (1970-09-01), Demerliac
patent: 4090126 (1978-05-01), Poticha et al.
patent: 4367438 (1983-01-01), Medwin
patent: 4408282 (1983-10-01), Hof
patent: 4458196 (1984-07-01), Goyal et al.
patent: 4473795 (1984-09-01), Wood
patent: 4481464 (1984-11-01), Noguchi et al.
patent: 4496900 (1985-01-01), DiStefano et al.
patent: 4570116 (1986-02-01), Tedd et al.
patent: 4580233 (1986-04-01), Parker et al.
patent: 4638242 (1987-01-01), Matsuno
patent: 4820969 (1989-04-01), Yonekura et al.
patent: 4868506 (1989-09-01), DiStefano et al.
patent: 4871962 (1989-10-01), Cheung
patent: 4902631 (1990-02-01), Downey et al.
patent: 4962461 (1990-10-01), Meyer et al.
patent: 5057441 (1991-10-01), Gutt et al.
patent: 5213985 (1993-05-01), Sandroff
Schepis Dominic J.
Seshan Krishna
International Business Machines - Corporation
Mortinger Alison D.
Solis Jose M.
Wieder Kenneth A.
LandOfFree
Instrument for the measurement of electrical characteristics dur does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Instrument for the measurement of electrical characteristics dur, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Instrument for the measurement of electrical characteristics dur will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2018998