Apparatus for characterizing conductivity of superconducting mat

Details Apparatus for characterizing conductivity of superconducting mat Apparatus for characterizing conductivity of superconducting mat

1991-04-24

1993-12-07

Snow, Walter E.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Distributive type parameters

324 716, 324236, G01N 2700

Patent

active

052686469

ABSTRACT:
Apparatus and method for noncontact, radio-frequency shielding current characterization of materials. Self- or mutual inductance changes in one or more inductive elements, respectively, occur when materials capable of supporting shielding currents are placed in proximity thereto, or undergo change in resistivity while in place. Such changes can be observed by incorporating the inductor(s) in a resonant circuit and determining the frequency of oscillation or by measuring the voltage induced on a coupled inductive element. The present invention is useful for determining the critical temperature and superconducting transition width for superconducting samples.

REFERENCES:
patent: 4220915 (1980-09-01), Kawamoto et al.
patent: 4257001 (1981-03-01), Partain et al.
J. D. Crowley et al., "Containerless Method of Measuring Resistivity," Rev. Sci. Instrum. 47(6), 712-715 (1976).
R. B. Goldfarb et al., "Calibration of AC Susceptometer for Cylindrical Specimens," Rev. Sci. Instrum. 55, 761 (1984).
A. L. Schawlow et al., "Effect of the Energy Gap on the Penetration Depth of Superconductors," Phys. Rev. 113(1), 120-126 (1959).
B. J. Dalrymple et al., "Upper Critical Fields of the Superconducting Layered Compounds Nb.sub.1-x Ta.sub.x Se.sub.2, " J. Low Temp. Phys. 56, Nos. 5/6, 545-574 (1984).

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