Testing timing parameters of high speed integrated circuit devic

Details Testing timing parameters of high speed integrated circuit devic Testing timing parameters of high speed integrated circuit devic

1992-06-05

1993-12-07

Nguyen, Vinh

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

371 251, G01R 3100

Patent

active

052686396

ABSTRACT:
A method and apparatus for testing input and output parameters for high speed integrated circuit devices. An integrated circuit tester generates a receive clock and a transmit clock using a pair of pre-selected output pins. The integrated circuit tester adjusts the phase relation between the transmit clock and the receive clock. Special circuitry within the device under test compares input and output data to detect errors.

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