Multi-octave spectroscopy with multi-waveband infrared focal pla

Details Multi-octave spectroscopy with multi-waveband infrared focal pla Multi-octave spectroscopy with multi-waveband infrared focal pla

1999-08-12

2000-08-15

Evans, F. L.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

25033907, G01J 318

Patent

active

061044881

ABSTRACT:
Spectra corresponding to overlapping grating orders are focused onto a multi-waveband focal plane array in order to create spectral images of a scene simultaneously in multiple wavelength regions. The blaze of the grating is chosen so that all spectral orders are dispersed with high grating efficiency. Such an approach extends the spectral range of disperse spectrometers to several octaves of wavelength, while preserving the compact packaging and cryogenic requirements of conventional (one octave) instruments.

REFERENCES:
patent: 5760899 (1998-06-01), Eismann
Reine et al., "Independently accessed back-to-back HgCdTe Photodiodes: A new dual-band IR detector," Journal of Electronic Materials, vol. 24, No. 5, 1995.

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