Semiconductor device testing apparatus

Details Semiconductor device testing apparatus Semiconductor device testing apparatus

1998-05-12

2000-08-15

Brown, Glenn W.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324765, 3241581, G01R 3126

Patent

active

061042048

ABSTRACT:
An IC tester is provided which is capable of preventing the temperature of an IC heated to a predetermined temperature from falling during the test. A box-like housing 70 constructed of a thermally insulating material is mounted on a performance board PB. An IC socket SK and a socket guide 35 are accommodated in a space bounded by the box-like housing 70 and the performance board PB. A through-aperture 71 is formed in the top wall of the housing 70 for passing an IC under test carried by a movable rod 60R of a Z-axis driver into and out of the interior of the housing 70. An opening/closing plate 72 is disposed over the housing 70 for movement in a horizontal direction. This plate 72 is adapted to close the through-aperture 71 of the housing 70 when the movable rod 60R is outside of the housing to thereby maintain the interior of the box-like 70 in an almost thermally insulated condition. In addition, a cover member 64 is disposed for closing the through-aperture 72A in the plate 72 when the IC under test is in contact with the IC socket to aid in maintaining the interior of the housing in a thermally insulated condition.

REFERENCES:
patent: 3408565 (1968-10-01), Frick, et al.
patent: 4782291 (1988-11-01), Blandin
patent: 4904934 (1990-02-01), Nishihashi et al.
patent: 4926118 (1990-05-01), O'Connor, et al.
patent: 5172049 (1992-12-01), Kiyokawa et al.
patent: 5198752 (1993-03-01), Miyata et al.

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