Method of producing semiconductor devices

Metal working – Method of mechanical manufacture – Assembling or joining

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

29578, 29591, 148187, H01L 2122

Patent

active

044134037

ABSTRACT:
Disclosed is a method of producing semiconductor devices, comprising forming a laminate of a lower poly-Si film and an upper silicon nitride film on the substrate surface in a manner to provide a pattern of electrodes and wiring layer, removing the patterned silicon nitride film except the region in which a conductive layer is brought into contact with the underneath poly-Si film later, subjecting the substrate surface region to thermal oxidation so as to form a silicon oxide film covering the exposed surface of the substrate and the exposed surface of the poly-Si film, and removing the remaining silicon nitride film.

REFERENCES:
patent: 4072545 (1978-02-01), De La Moneda
patent: 4180826 (1979-12-01), Shappir
patent: 4231051 (1980-10-01), Custode et al.
patent: 4253229 (1981-03-01), Yeh et al.
patent: 4282647 (1981-08-01), Richman

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of producing semiconductor devices does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of producing semiconductor devices, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of producing semiconductor devices will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2001871

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.