Patent
1977-12-08
1979-04-24
Wojciechowicz, Edward J.
357 55, 357 88, 357 89, 357 91, H01L 2972
Patent
active
041515404
ABSTRACT:
High beta, high frequency transistors require very narrow and high resistance base structures, thereby placing a low limit of collector-emitter voltages that may be used without encountering "punch-through" breakdown. This invention permits the use of normal collector-emitter voltages without danger of punch-through problems by injecting into the high resistance base material an impurity grid that serves both as an electrostatic shield to increase the voltage breakdown level, and as a means of reducing the apparent lateral base resistance, thereby further increasing the high frequency capability of the device without degrading the high beta characteristics.
REFERENCES:
patent: 3906545 (1975-09-01), Schlangenotto et al.
patent: 4007474 (1977-02-01), Yagi et al.
patent: 4035825 (1977-07-01), Kirschner
Sander Wendell B.
Shepherd William H.
Colwell Robert C.
Fairchild Camera and Instrument Corporation
MacPherson Alan H.
Winters Paul J.
Wojciechowicz Edward J.
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