Method for growing low defect, high purity crystalline layers ut

Metal treatment – Process of modifying or maintaining internal physical... – Chemical-heat removing or burning of metal

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29576E, 29576J, 29576W, 29575, 29578, 148174, 148DIG26, 148DIG85, 148DIG150, 156612, 156DIG65, 156DIG88, 357 4, 357 50, H01L 2120, H01L 2176

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046120726

ABSTRACT:
The purity and perfection of a semiconductor is improved by depositing a patterned mask (12) of a material impervious to impurities of the semiconductor on a surface (14) of a blank (10). When a layer (40) of semiconductor is grown on the mask, the semiconductor will first grow from the surface portions exposed by the openings (16) in the mask (12) and will bridge the connecting portions of the mask to form a continuous layer (40) having improved purity, since only the portions (42) overlying the openings (16) are exposed to defects and impurities. The process can be reiterated and the mask translated to further improve the quality of grown layers.

REFERENCES:
patent: 3564358 (1971-02-01), Hahnlein
patent: 3634150 (1972-01-01), Horn
patent: 4378629 (1983-04-01), Bozler et al.
patent: 4482422 (1984-11-01), McGinn
Tausch et al., "Novel Crystal Growth . . . Overgrowth Onto Silicon Dioxide", J. Electrochem. Soc., vol. 112, No. 7, Jul. 1965, pp. 706-709.

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