FDIC method for minimizing measuring failures in a measuring sys

Details FDIC method for minimizing measuring failures in a measuring sys FDIC method for minimizing measuring failures in a measuring sys

1995-12-26

1997-08-26

Beausoliel, Jr., Robert W.

Excavating

371 671, 376245, 367124, 364560, 36457102, G06F 1100, G21C 1700

Patent

active

056617356

ABSTRACT:
A method for minimizing measured quantities determined from sensors affected by measuring failures and detected by a plurality of redundant sensors connected to form a measuring system by detecting and isolating the sensors affected by failures. Sensor values measured by all the sensors are mapped by a linear transformation into a vector in the parity space (parity vector). The dimension of the parity space is determined by the redundance of the measuring system (i.e., the number of sensors and the dimension of the quantity to be measured).
The subspaces at each failure level that contain the largest proportion of the measured parity vector are determined by projection of the measured parity vector onto all possible subspaces. The best sensor combination at each failure level can be determined by omitting the sensor combinations belonging to such subspaces.

REFERENCES:
patent: 4472806 (1984-09-01), Blair
patent: 4772445 (1988-09-01), Nasrallah et al.
patent: 5479161 (1995-12-01), Keyes et al.

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