Method and apparatus for programming signal timing

Details Method and apparatus for programming signal timing Method and apparatus for programming signal timing

1994-01-31

1996-11-26

Nguyen, Viet Q.

Excavating

371 62, 327263, 327264, G11C 1700

Patent

active

055793266

ABSTRACT:
A method and apparatus for testing and programming signal timing are disclosed which can be incorporated into an integrated circuit device utilizing on-chip timed command signals and pulses. The method of the invention enables nonpermanent testing and retesting of a device at various operational speeds during production testing. During retesting, temporary signal delays are selectively introduced into the circuit of a device which failed a previous test due to non-repairable errors. Once a device passes the production test error-free or with repairable errors, the temporary signal delays are permanently programmed into the device. Specifically, the method utilizes one or a plurality of mode control circuits and test voltage input terminals to nonpermanently select signal delays which may be identified and permanently enabled at a later time.

REFERENCES:
patent: 5124584 (1992-06-01), McClure
patent: 5262994 (1993-11-01), McClure
patent: 5265100 (1993-11-01), McClure et al.
patent: 5355344 (1994-10-01), McClure
patent: 5361230 (1994-11-01), Ikeda et al.
patent: 5384741 (1995-01-01), Haraguchi et al.
patent: 5404331 (1995-04-01), McClure

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