Encoding apparatus for making measurements of two-dimensional di

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer

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356363, 250237G, G01B 902

Patent

active

055791115

ABSTRACT:
An encoding apparatus includes: a light source; a diffraction grating, including a number of fine grating portions orthogonally arranged in columns and rows in a diffraction grating surface, for producing first diffracted light rays and second diffracted light rays in accordance with light emitted from the light source, each of the first diffracted light rays having a direction cosine on a first plane, and each of the second diffracted light rays having a direction cosine on a second plane; an interference unit for producing a first interference light ray by subjecting two diffracted light rays of the first diffracted light rays to interference, and for producing a second interference light ray by subjecting two diffracted light rays of the second diffracted light rays to interference; a first detection unit for detecting a phase change of the first interference light ray when an object is moved relative to the light source; and a second detection unit for detecting a phase change of the second interference light ray when the object is moved relative to the light source.

REFERENCES:
patent: 3756723 (1973-09-01), Hock
patent: 4676645 (1987-06-01), Taniguchi et al.
patent: 4776701 (1988-10-01), Pettigrew
patent: 5000542 (1991-03-01), Nishimura et al.
patent: 5101102 (1992-03-01), Nishimura et al.
patent: 5104225 (1992-04-01), Masreliez
patent: 5204524 (1993-04-01), Ichikawa et al.
patent: 5206704 (1993-04-01), Huber et al.
patent: 5214280 (1993-05-01), Rieder et al.
patent: 5258861 (1993-11-01), Tsuchiya
patent: 5333048 (1994-07-01), Michel et al.
patent: 5369486 (1994-11-01), Matsumoto et al.
patent: 5390022 (1995-02-01), Ishizuka et al.
patent: 5404220 (1995-04-01), Takeuchi et al.

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