Apparatus for measuring the thickness and/or irregularity of sli

Details Apparatus for measuring the thickness and/or irregularity of sli Apparatus for measuring the thickness and/or irregularity of sli

1996-07-01

1997-12-16

Biegel, Ronald L.

Measuring and testing

Sheet, woven fabric or fiber

Filament

73 377, D01H 500

Patent

active

056972474

ABSTRACT:
The invention relates to a device for measuring the thickness and/or irregularity of slivers, with a compacting part (2) compacting the sliver and with a measuring part which has a gutter-like guide conduit (8) for the compacted sliver and a sensing member (10) which senses the sliver mechanically and which is adjustable relative to the guide conduit. In order to allow more accurate measurement, the sensing member is likewise of gutter-like design in a region in contact with the sliver and forms a kind of guide conduit (15), so that, in the measuring part, the sliver runs through a guide conduit consisting of a fixed part (13) and of a part (14) adjustable relative to the fixed part (13). The adjustable part is fastened to deflectable carriers (11, 12), and the measurement of the thickness and/or irregularity of the sliver is carried out by measuring the adjustment of at least one of the said carriers.

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patent: 5461757 (1995-10-01), Leifeld

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