Test carrier for semiconductor integrated circuit and method of

Details Test carrier for semiconductor integrated circuit and method of Test carrier for semiconductor integrated circuit and method of

1995-03-03

1998-05-26

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

G01R 3128

Patent

active

057571996

ABSTRACT:
The test carrier for the semiconductor integrated circuit device according to the present invention comprises a substrate and a substrate covering sheet. The substrate includes thereon a semiconductor chip, in which a semiconductor integrated circuit is formed, such that electrodes of the semiconductor chip are positioned upwardly. The covering sheet has contact pads to be contacted to the electrodes of the semiconductor chip and formed on one surface thereof, and has connecting wirings to be connected to the contact pads and formed on the other surface thereof.

REFERENCES:
patent: 4038599 (1977-07-01), Bove et al.
patent: 5378982 (1995-01-01), Feigenbaum et al.
patent: 5412866 (1995-05-01), Woith et al.
patent: 5477082 (1995-12-01), Buckley, III et al.
patent: 5491427 (1996-02-01), Ueno et al.

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