Filter device with memory test circuit

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36472416, G06F 1531

Patent

active

055008100

ABSTRACT:
A filter device with memory test circuit easily executes a memory test inspite of single-bit data processing to 1 bit data. The filter device with a memory test circuit includes a memory test circuit between a memory means and a shift register, sequentially reads digital data and tests digital data at the external Central Processing Unit (CPU) after converting the data from parallel to serial at the shift register.

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patent: 5163154 (1992-11-01), Bournas et al.
patent: 5235538 (1993-08-01), Sumi et al.
patent: 5365466 (1994-11-01), Hazard
Massara, Robert E., "Synthesis of Low-Pass Forms", The Electrical Engineering Handbook, 1993, pp. 674-691.

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