Completely wireless dual-access test fixture

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

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Details

324754, 324758, G01R 3102

Patent

active

055006060

ABSTRACT:
A test fixture including top and bottom probe plates including double-ended pogo pins interfacing top and bottom interface printed circuit board (IPCBs), further including double-ended transfer pins to achieve a true wireless dual access test fixture. The top transfer pins electrically engage the bottom transfer pins after vacuum is applied to allow electrical interface with the top-side fixture without the use of wires. The top fixture mounts in a frame assembly through a parallel linkage keeping the top fixture parallel with the PCB under test. Guide pins mounted on the bottom probe plate are used to align a top plate holding the PCB and also to pre-align with bushings on the top fixture before vacuum is applied. When vacuum is applied, the top plate and top fixture move in a single longitudinal direction to electrically engage the test pins and test pads, preventing lateral movement which heretofore caused significant damage to the test pins and test pads.

REFERENCES:
patent: 3970934 (1976-07-01), Aksu
patent: 4099120 (1978-07-01), Aksu
patent: 5087878 (1992-02-01), Belmore, III et al.
patent: 5157325 (1992-10-01), Murphy

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