Method and apparatus for testing integrated circuit devices

Details Method and apparatus for testing integrated circuit devices Method and apparatus for testing integrated circuit devices

1994-07-20

1996-03-19

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324765, G01R 3128

Patent

active

055005888

ABSTRACT:
A relatively large number of test fixtures are provided for an available tester. The tester is programmed to access the individual test fixtures independently, and does so only when the devices connected to them are to be tested. When the test fixtures are not in such a test mode, local power sources provided for each fixture are used to apply stress voltages to the devices being tested. This frees the tester from the requirement for providing stressing voltages to the devices, allowing it to be efficiently used to perform testing on a larger number of devices concurrently.

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