Optics: measuring and testing – By polarized light examination
Patent
1994-12-20
1996-09-03
Gonzalez, Frank
Optics: measuring and testing
By polarized light examination
356367, G01J 400
Patent
active
055528899
ABSTRACT:
In order to be independent of temperature when evaluating polarization-modulated light signals, DC and AC components from light power signals (S.sub.1, S.sub.2) are evaluated separately. The algorithm necessary for this purpose is specified.
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patent: 5335066 (1994-08-01), Yamada et al.
Stierlin, Roland, "Faseroptische Sensoreu", Optoelektronic, Bulletin SEV/VSE 82, Jan. 1991, pp. 21-29.
ABB Research Ltd.
Eisenberg Jason D.
Gonzalez Frank
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