Geometrical instruments – Miscellaneous – Light direction
Patent
1994-09-06
1996-09-03
Cuchlinski, Jr., William A.
Geometrical instruments
Miscellaneous
Light direction
340551, G01B 1324
Patent
active
055511589
DESCRIPTION:
BRIEF SUMMARY
BACKGROUND OF THE INVENTION
Method and device for measuring position and angle with variable accuracy.
When measuring the position a measuring body or an angular alignment of the measuring body in relation to a reference axis it is of advantage if the measuring body can move freely in a measuring volume, i.e. without bearing on a measuring path or the like. It would also be of advantage if the sensing of the measuring body could take place without contact.
SUMMARY OF THE INVENTION
One object of the present invention is to achieve a method and a device which makes such a measurement possible. Furthermore, according to a further development of the invention a procedure has been achieved which makes a dynamically adjustable accuracy of measurement possible in a given measurement volume.
The measurement procedure according to the present invention is based on certain magnetic and mechanical properties of element in the shape of bands, threads or strips of a material which is amorphously changed when the elements are exposed to a magnetic field, what is called a bias field. For example the position/direction of the element is related to the magnetic field in the longitudinal or axial direction of the amorphous element, thereby making the mechanical resonance frequency of the element a measure of the position/direction of the element. The same procedure is adaptable for a measuring component comprising an amorphous element which is magnetically connected to an inductive element which in turn is a part of an electric resonance circuit. When the magnetic field is changed, the magnetic properties of the amorphous elements are changed so that the inductance of the inductive element is changed. Thereby the resonance frequency of the electric resonance circuit is also changed.
Other materials than amorphous materials are also applicable according to the invention. The crucial property of the material is its characteristics, e.g. magnetic or elastic properties, are influenced by magnetic fields. The influence should be of such an extent that the change in properties can be measurable by remote detection. Examples are materials which are magnetoresistive, the electric conductivity of which are changed in dependence of the magnetic field, and magnetooptical, the light conducting property of which are changed in dependence of applied magnetic field. For materials of the latter type that phenomonen which is called the Faraday-effect can be used, i.e. the plane of oscillation for polarized light is rotated, the deflection angle being proportional to the magnetized field strength, or the phenomonen which is called the Kerrer-effect, whereby a similar effect of certain materials is achieved by the influence of an electric field.
The resonance frequency of an amorphous element exhibiting a comparatively great magneto-mechanical coupling is varied with the intensity of the magnetic flow along the main direction of the element by what is called the delta-E-effect. Thus, if this intensity of magnetic flow is changed as a function of the position/direction of the amorphous element the resonance frequency of the amorphous element will be a function of its position/direction. It is very advantageous to give the measuring information in form of a frequency value since such a value is very immune to noise. Furthermore, mixed information from several measurement transmitters operating on different frequency bands can be transmitted together on one information channel.
In order to achieve an enhanced position of measurement procedures can be used where several amorphous elements are placed in a measuring body. In these instances it is also suitable to register difference and sum frequencies. By utilizing such differential measurement procedures sources of errors can be eliminated, such as for example distortion of the system caused by temperature, properties of the material, changes in the field, etc.
It should be noted that the effective magnetic field along the axial direction of the amorphous element is not necessarily equal to t
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Persson Leif A.
Tyren Carl
Bennett G. Bradley
Cuchlinski Jr. William A.
RSO Corporation N.V.
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