Excavating
Patent
1992-08-31
1995-02-21
Voeltz, Emanuel T.
Excavating
371 221, 371 225, G01R 3128
Patent
active
053922964
ABSTRACT:
A testing circuit for scan-pass testing an integrated circuit comprises a chain of serially connected scan-pass registers where an individual scan-pass register in the chain can be programmably selected for observation at a shift-out port located at the last scan-pass register in the serial chain. To programmably select a particular register, while a test signal is held active, a clock is pulsed and each clock pulse selects the next scan-pass register in the chain for observation, starting with the first scan-pass register. The register selected when the test signal becomes inactive is the register that is observed at the shift-out port at the end of the scan-pass register chain. The testing circuit permits the value of any register in the chain to be output in real-time without circuit interruption.
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NEC Corporation
Stamber Eric W.
Voeltz Emanuel T.
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